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Artikelnummer: | SN74BCT8245ANTG4 |
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Hersteller / Marke: | N/A |
Teil der Beschreibung.: | IC SCAN TEST DEVICE TXRX 24-DIP |
Datenblätte: |
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RoHs Status: | ROHS3 -konform |
ECAD -Modell: | |
Zahlungsmittel: | PayPal / Credit Card / T/T |
Versandweg: | DHL / Fedex / TNT / UPS / EMS |
Aktie: |
Ship From: Hong Kong
Online -RFQ -Einreichungen: Schnelle Antworten, bessere Preise!
Produkteigenschaften | Eigenschaften |
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Versorgungsspannung | 4.5V ~ 5.5V |
Supplier Device-Gehäuse | 24-PDIP |
Serie | 74BCT |
Verpackung / Gehäuse | 24-DIP (0.300", 7.62mm) |
Paket | Tube |
Betriebstemperatur | 0°C ~ 70°C |
Produkteigenschaften | Eigenschaften |
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Anzahl der Bits | 8 |
Befestigungsart | Through Hole |
Logiktyp | Scan Test Device with Bus Transceivers |
Grundproduktnummer | 74BCT8245 |
SN74BCT8245ANTG4 Einzelheiten PDF [English] | SN74BCT8245ANTG4 PDF - EN.pdf |
BOUNDARY SCAN BUS DRIVER
IC SCAN TEST DEVICE BUFF 24-DIP
IC SCAN TEST DEVICE 24SOIC
IC SCAN TEST DEVICE W/FF 24-SOIC
IC SCAN TEST DEVICE TXRX 24-SOIC
IC SCAN TEST DEVICE TXRX 24-SOIC
IC SCAN TEST DEVICE BUFF 24-SOIC
IC SCAN TEST DEVICE LATCH 24SOIC
IC SCAN TEST DEVICE BUFF 24-DIP
BOUNDARY SCAN BUS DRIVER
BOUNDARY SCAN BUS DRIVER
IC SCAN TEST DEVICE LATCH 24SOIC
IC SCAN TEST DEVICE BUFF 24-SOIC
IC SCAN TEST DEVICE W/FF 24-SOIC
IC SCAN TEST DEVICE BUFF 24-DIP
IC SCAN TEST DEVICE LATCH 24-DIP
IC SCAN TEST DEVICE BUFF 24-DIP
IC SCAN TEST DEVICE BUFF 24-SOIC
IC SCAN TEST DEVICE TXRX 24-DIP
IC SCAN TEST DEVICE LATCH 24SOIC
2024/06/6
2024/04/18
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2023/12/20
![]() SN74BCT8245ANTG4 |
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